Abstract
Quantitative and qualitative analysis of geological samples (rocks and river sediments) was performed on Xenemetrix EDXRF Benchtop Spectrometer System, model X-Calibur
Objective:
- Perform XRF measurements on certified geological reference materials to build calibration curves for the major oxides (Na2O, MgO, SiO2, Al2O3, SiO2, P2O5, SO3, K2O, CaO, TiO2, MnO and Fe2O3) and for trace elements Cr, Co, Ni and Pb in these samples.
- Quantify geological samples of unknown concentrations with respect to oxides and trace elements using the above dscribed calibration curves to.
Background:
EDXRF is a fast and non-destructive technique that can quantify any type of sample in solid, powder or liquid form within a few minutes and can be the method of choice. Energy Dispersive X-ray Fluorescence (EDXRF) spectrometers can play an important role in assuring that consistent quality of samples are retained throughout a manufacturing process.
EDXRF is an ideal method for a quick and simple elemental analysis for industrial control purposes offering the following advantages: 1.) Fast and minimal sample preparation, 2.) An automated analysis process, 3.) Limited or no exposure to corrosive reagents used by other analytical techniques, 4.) Ease of use for operation by non-technical or non-specialized personnel.