Abstract
A quantitative analysis of Iron in flour via Xenemetrix EDXRF Laboratory Spectrometer System was performed by model EX-3600M. The minimum detection limit for Fe in flour matrix was determined to 0.8 ppm at 3 sigma.
Objective
To design an easy method by using EDXRF technique for quick and convenient measurements of Fe in flour at the level of tens of ppm.
Background
EDXRF is a fast and non-destructive technique that can quantify any type of samples in solid, powder or liquid form within a few minutes. Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer plays an important role in assuring the consistent quality of samples that are retained throughout a manufacturing process.
EDXRF is an ideal method for a quick and simple elemental analysis for industrial control purposes offering the following advantages: 1.) Fast and minimal sample preparation, 2.) An automated analysis process, 3.) Limited or no exposure to corrosive reagents used by other analytical techniques, 4.) Ease of use for operation by non-technical or non-specialized personnel.