Abstract
The minimum detection limits of several different elements in water and in oil solutions were determined on X-Calibur with a SDD detector installed or a Si-PIN diode detector installed. The MDL was determined at 3 sigma and 300 seconds acquisition times. The result is reported here.
Objective
To perform a quantitative comparison between the performance of X-Calibur with a SDD detector installed or a Si-PIN diode detector installed. The sensitivity and the performance of X-Calibur at different energies when equipped with different detectors is expressed in the minimum detection limits of the different elements.
Background
EDXRF is a fast and non-destructive technique that can quantify any type of sample solid, powder or liquid from within a few minutes and can be the method of choice. Energy Dispersive X-ray Fluorescence (EDXRF) spectrometers can play an important role in assuring that consistent quality of samples are retained throughout a manufacturing process.
SDD versus Si PIN diode detector
Xenemetrix benchtop EDXRF analyzers have traditionally been equipped with Si-PIN diode with outstanding features regarding resolution and high count rate capacity. However a few years ago the Silicon drift detector was introduced into the EDXRF market and today it has become “the detector of choice” for many EDXRF applications.
The SDD has better energy resolution than a Si-PIN of the same area. The SDD has much better energy resolution at short peaking times, which is particularly helpful at high count rate. The Si-PIN is available with a larger active area and thicker depletion depth. Where resolution is not critical but high detection efficiency is important, the Si-PIN is the detector of choice.